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Information card for entry 4347553
Preview
Coordinates | 4347553.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H30 I4 O2 P2 Sn |
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Calculated formula | C36 H30 I4 O2 P2 Sn |
SMILES | [Sn](I)(I)(I)(I)([O]=P(c1ccccc1)(c1ccccc1)c1ccccc1)[O]=P(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Influence of π-Iodide Intermolecular Interactions on Electronic Properties of Tin(IV) Iodide Semiconducting Complexes. |
Authors of publication | Wlaźlak, Ewelina; Macyk, Wojciech; Nitek, Wojciech; Szaciłowski, Konrad |
Journal of publication | Inorganic chemistry |
Year of publication | 2016 |
Journal volume | 55 |
Journal issue | 12 |
Pages of publication | 5935 - 5945 |
a | 10.293 ± 0.005 Å |
b | 16.785 ± 0.005 Å |
c | 11.494 ± 0.005 Å |
α | 90° |
β | 109.527 ± 0.005° |
γ | 90° |
Cell volume | 1871.6 ± 1.3 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0294 |
Residual factor for significantly intense reflections | 0.0249 |
Weighted residual factors for significantly intense reflections | 0.0398 |
Weighted residual factors for all reflections included in the refinement | 0.0418 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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