Information card for entry 4347965

Structure parameters

• Formula: C88 H124 N2 O4 Si4 Sm2
• Calculated formula: C88 H124 N2 O4 Si4 Sm2
• SMILES: C(C)(C)[Si](C(C)C)(C(C)C)N([Si](C(C)C)(C(C)C)C(C)C)[Sm]1OC(c2ccccc2)(c2ccccc2)C2C=CC(=C(c3ccccc3)O[Sm](N([Si](C(C)C)(C(C)C)C(C)C)[Si](C(C)C)(C(C)C)C(C)C)OC(c3ccccc3)(c3ccccc3)C3C=CC(=C(O1)c1ccccc1)C=C3)C=C2
• Title of publication: Physicochemical Properties of Near-Linear Lanthanide(II) Bis(silylamide) Complexes (Ln = Sm, Eu, Tm, Yb).
• Authors of publication: Goodwin, Conrad A. P.; Chilton, Nicholas F.; Vettese, Gianni F.; Moreno Pineda, Eufemio; Crowe, Iain F.; Ziller, Joseph W.; Winpenny, Richard E. P.; Evans, William J.; Mills, David P.
• Journal of publication: Inorganic chemistry
• Year of publication: 2016
• Journal volume: 55
• Journal issue: 20
• Pages of publication: 10057 - 10067
• a: 14.605 ± 0.002 Å
• b: 18.611 ± 0.002 Å
• c: 15.9 ± 0.002 Å
• α: 90°
• β: 106.146 ± 0.016°
• γ: 90°
• Cell volume: 4151.4 ± 1 ų
• Cell temperature: 150.02 ± 0.1 K
• Ambient diffraction temperature: 150.02 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.124
• Residual factor for significantly intense reflections: 0.0607
• Weighted residual factors for significantly intense reflections: 0.0762
• Weighted residual factors for all reflections included in the refinement: 0.0923
• Goodness-of-fit parameter for all reflections included in the refinement: 0.943
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No