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Information card for entry 4348107
Preview
| Coordinates | 4348107.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H14 N3 O3 Re |
|---|---|
| Calculated formula | C15 H14 N3 O3 Re |
| SMILES | c1cc2CN3CCN4C(=O)c5cccc[n]5[Re]34(=O)Oc2cc1 |
| Title of publication | Synthesis of Oxorhenium(V) and Oxotechnetium(V) Complexes That Bind to Amyloid-β Plaques. |
| Authors of publication | Hayne, David J.; White, Jonathan M.; McLean, Catriona A.; Villemagne, Victor L.; Barnham, Kevin J.; Donnelly, Paul S. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 16 |
| Pages of publication | 7944 - 7953 |
| a | 12.4901 ± 0.0004 Å |
| b | 8.0225 ± 0.0004 Å |
| c | 13.8963 ± 0.0004 Å |
| α | 90° |
| β | 100.626 ± 0.003° |
| γ | 90° |
| Cell volume | 1368.56 ± 0.09 Å3 |
| Cell temperature | 130 ± 0.1 K |
| Ambient diffraction temperature | 130 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0344 |
| Residual factor for significantly intense reflections | 0.0272 |
| Weighted residual factors for significantly intense reflections | 0.0558 |
| Weighted residual factors for all reflections included in the refinement | 0.059 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4348107.html
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Users of the data should acknowledge the original authors of the
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