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Information card for entry 4348134
Preview
Coordinates | 4348134.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H239 La N24 O97 Pd12 S24 |
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Calculated formula | C72 H141 La N24 O48 Pd12 S24 |
SMILES | C([C@H](C(=O)[O-])[NH3+])[S]1[Pd]23[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]45[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]6([S]4C[C@@H](C(=O)[O-])[NH3+])[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]47[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]8([S]4C[C@@H](C(=O)[O-])[NH3+])[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]1([S]2C[C@@H](C(=O)[O-])[NH3+])[S]8C[C@@H](N)C(=O)O[La]12489%10(OC([C@H](C[S]67)[NH3+])=[O]4)([O]=C([C@H](C[S]35)[NH3+])O1)[O]=C(O8)[C@@H]([NH3+])C[S]1[Pd]34[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]5([S]3C[C@@H](C(=O)[O-])[NH3+])[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]3([S]5C[C@@H](C(=[O]9)O%10)N)[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]5([S]3C[C@@H](C(=O)[O-])[NH3+])[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]3([S]5C[C@@H](C(=O)O2)N)[S](C[C@@H](C(=O)[O-])[NH3+])[Pd]1([S]3C[C@@H](C(=O)[O-])[NH3+])[S]4C[C@@H](C(=O)[O-])[NH3+] |
Title of publication | Chiral Dodecanuclear Palladium(II) Thio Cluster: Synthesis, Structure, and Formation Mechanism Explored by ESI-MS and DFT Calculations. |
Authors of publication | Lin, Zheng-Guo; Fan, Lin-Yuan; Kondinski, Aleksandar; Vankova, Nina; Heine, Thomas; Chen, Bao-Kuan; Haider, Ali; Wang, Bo; Kortz, Ulrich; Hu, Chang-Wen |
Journal of publication | Inorganic chemistry |
Year of publication | 2016 |
Journal volume | 55 |
Journal issue | 16 |
Pages of publication | 7811 - 7813 |
a | 13.2873 ± 0.0007 Å |
b | 15.6841 ± 0.0008 Å |
c | 23.4478 ± 0.0013 Å |
α | 89.565 ± 0.001° |
β | 74.32 ± 0.001° |
γ | 83.072 ± 0.001° |
Cell volume | 4668.7 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 1 |
Hermann-Mauguin space group symbol | P 1 |
Hall space group symbol | P 1 |
Residual factor for all reflections | 0.0919 |
Residual factor for significantly intense reflections | 0.0835 |
Weighted residual factors for significantly intense reflections | 0.2474 |
Weighted residual factors for all reflections included in the refinement | 0.2671 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4348134.html
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