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Information card for entry 4348226
Preview
Coordinates | 4348226.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H66 As P3 |
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Calculated formula | C54 H66 As P3 |
SMILES | [As](c1ccc2c3c(ccc(P(C(C)C)C(C)C)c13)CC2)(c1ccc2c3c(ccc(P(C(C)C)C(C)C)c13)CC2)c1ccc2c3c(ccc(P(C(C)C)C(C)C)c13)CC2 |
Title of publication | Geminally Substituted Tris(acenaphthyl) and Bis(acenaphthyl) Arsines, Stibines, and Bismuthine: A Structural and Nuclear Magnetic Resonance Investigation. |
Authors of publication | Chalmers, Brian A.; Meigh, Christina B. E.; Nejman, Phillip S.; Bühl, Michael; Lébl, Tomáš; Woollins, J. Derek; Slawin, Alexandra M. Z.; Kilian, Petr |
Journal of publication | Inorganic chemistry |
Year of publication | 2016 |
Journal volume | 55 |
Journal issue | 14 |
Pages of publication | 7117 - 7125 |
a | 10.184 ± 0.002 Å |
b | 11.385 ± 0.002 Å |
c | 21.809 ± 0.004 Å |
α | 90.654 ± 0.002° |
β | 100.864 ± 0.004° |
γ | 111.008 ± 0.004° |
Cell volume | 2309.6 ± 0.7 Å3 |
Cell temperature | 93 K |
Ambient diffraction temperature | 93 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0543 |
Residual factor for significantly intense reflections | 0.0387 |
Weighted residual factors for significantly intense reflections | 0.0947 |
Weighted residual factors for all reflections included in the refinement | 0.1029 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4348226.html
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