Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4350637
Preview
Coordinates | 4350637.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [(CF3,F-Ph)2TAP]CuCO |
---|---|
Formula | C23 H6 Cu F22 N3 O |
Calculated formula | C23 H6 Cu F22 N3 O |
SMILES | [Cu]1(N(C(=NC(=[N]1c1c(cccc1C(F)(F)F)F)C(C(C(F)(F)F)(F)F)(F)F)C(C(C(F)(F)F)(F)F)(F)F)c1c(cccc1C(F)(F)F)F)C#[O] |
Title of publication | Syntheses of highly fluorinated 1,3,5-triazapentadienyl ligands and their use in the isolation of copper(I)-carbonyl and copper(I)-ethylene complexes. |
Authors of publication | Dias, H. V. Rasika; Singh, Shreeyukta; Flores, Jaime A. |
Journal of publication | Inorganic chemistry |
Year of publication | 2006 |
Journal volume | 45 |
Journal issue | 22 |
Pages of publication | 8859 - 8861 |
a | 24.6256 ± 0.0016 Å |
b | 9.7507 ± 0.0006 Å |
c | 25.1455 ± 0.0016 Å |
α | 90° |
β | 113.278 ± 0.001° |
γ | 90° |
Cell volume | 5546.4 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0776 |
Residual factor for significantly intense reflections | 0.0556 |
Weighted residual factors for significantly intense reflections | 0.1461 |
Weighted residual factors for all reflections included in the refinement | 0.1626 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4350637.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.