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Information card for entry 4500177
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Coordinates | 4500177.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | CoW12Si-DMF |
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Formula | C54 H156 Cl Co3 N30 O95 Si2 W24 |
Calculated formula | C54 H156 Cl Co3 N30 O95 Si2 W24 |
SMILES | C1C[NH2][Co]23([NH2]CC[NH2]2)([NH2]1)[NH2]CC[NH2]3.C(=O)N(C)C.C(=O)N(C)C.C(=O)N(C)C.C1C[NH2][Co]23([NH2]CC[NH2]2)([NH2]1)[NH2]CC[NH2]3.C1C[NH2][Co]23([NH2]CC[NH2]3)([NH2]CC[NH2]2)[NH2]1.C(=O)N(C)C.CN(C=O)C.CN(C=O)C.CN(C=O)C.CN(C=O)C.C(=O)N(C)C.CN(C)C=O.CN(C)C=O.C(=O)N(C)C.[Cl-].O1[W]234(=O)O[W]567(=O)O[W]89%10(O[W]%11%12%13(O[W]%141(O[W]1%15(=O)(O[W]%16%17%18(O[W]%19(O%11)(=O)(O[W]%11%20(O%16)(=O)O[W]%16%21(O[W](O8)(=O)([O]%11%21[Si]([O]25%14)([O]%15%18[W](O%16)(O%17)(O1)(=O)O4)[O]9%13%19)(O6)O%20)(=O)O3)O%10)=O)O%12)(=O)O7)=O)=O.O=[W]1234O[W]567(=O)O[W]89(O2)(=O)O[W]2%10%11(O[W]%12%13(O3)([O]32[Si]2([O]%14%15[W]%16%17(O5)(O[W]5%18(O6)(=O)O[W]6%19(O[W]%15(O%16)(=O)(O[W]%14(O8)(O%10)(O%17)=O)O[W]3(O6)(O%12)(=O)O%11)(O[W](O1)(=O)(O5)(O%13)[O]2%18%19)=O)=O)[O]479)=O)=O.O.O.O |
Title of publication | Structural and Selective Gas Adsorption Studies of Polyoxometalate and Tris(ethylenediamine) Cobalt(III) Based Ionic Crystals |
Authors of publication | Dey, Chandan; Das, Raja; Pachfule, Pradip; Poddar, Pankaj; Banerjee, Rahul |
Journal of publication | Crystal Growth & Design |
Year of publication | 2011 |
Journal volume | 11 |
Journal issue | 1 |
Pages of publication | 139 |
a | 13.1948 ± 0.0011 Å |
b | 20.9672 ± 0.0018 Å |
c | 29.02 ± 0.003 Å |
α | 93.34 ± 0.001° |
β | 95.474 ± 0.001° |
γ | 97.373 ± 0.002° |
Cell volume | 7905.7 ± 1.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0933 |
Residual factor for significantly intense reflections | 0.0782 |
Weighted residual factors for significantly intense reflections | 0.2046 |
Weighted residual factors for all reflections included in the refinement | 0.2179 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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