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Information card for entry 4500475
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Coordinates | 4500475.cif |
---|---|
Original paper (by DOI) | HTML |
External links | ChemSpider |
Chemical name | 2,2'-((octyl-9H-fluorene-2,7-diyl)bis(4,1 phenylene))bisbenzo[d]thiazole |
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Formula | C55 H56 N2 S2 |
Calculated formula | C55 H56 N2 S2 |
SMILES | c1c(c2ccc(c3nc4c(cccc4)s3)cc2)ccc2c1C(CCCCCCCC)(CCCCCCCC)c1c2ccc(c1)c1ccc(c2nc3c(cccc3)s2)cc1 |
Title of publication | Polymorphism in Opto-Electronic Materials with a Benzothiazole-fluorene Core: A Consequence of High Conformational Flexibility of π-Conjugated Backbone and Alkyl Side Chains |
Authors of publication | Dikundwar, Amol G.; Dutta, Gitish K.; Guru Row, Tayur N.; Patil, Satish |
Journal of publication | Crystal Growth & Design |
Year of publication | 2011 |
Journal volume | 11 |
Journal issue | 5 |
Pages of publication | 1615 |
a | 8.2872 ± 0.0004 Å |
b | 14.9135 ± 0.0009 Å |
c | 17.9141 ± 0.001 Å |
α | 88.609 ± 0.005° |
β | 88.098 ± 0.004° |
γ | 86.185 ± 0.005° |
Cell volume | 2207.4 ± 0.2 Å3 |
Cell temperature | 295 ± 1 K |
Ambient diffraction temperature | 295 ± 1 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1163 |
Residual factor for significantly intense reflections | 0.0597 |
Weighted residual factors for significantly intense reflections | 0.1051 |
Weighted residual factors for all reflections included in the refinement | 0.1306 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.983 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4500475.html
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Users of the data should acknowledge the original authors of the
structural data.