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Information card for entry 4500775
Preview
Coordinates | 4500775.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H40 Cl6 Co N2 O2 S |
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Calculated formula | C33 H40 Cl6 Co N2 O2 S |
SMILES | [Co]12345678([c]9([c]1([c]2([c]3([c]49C)C)C)C)C)[c]1([c]8([c]7([c]6([c]51C)C)C)C)C.s1nc2C(=O)c3ccccc3C(=O)c2n1.C(Cl)Cl.C(Cl)Cl.C(Cl)Cl |
Title of publication | [TDNQ][CoCp*2] and [TDNQ]3[CoCp2]2; Radical Anions of a 1,2,5-Thiadiazolo-naphthoquinone |
Authors of publication | Morgan, Ian S.; Jennings, Michael; Vindigni, Alessandro; Clérac, Rodolphe; Preuss, Kathryn E. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2011 |
Journal volume | 11 |
Journal issue | 6 |
Pages of publication | 2520 |
a | 10.359 ± 0.003 Å |
b | 11.832 ± 0.003 Å |
c | 15.753 ± 0.004 Å |
α | 90.486 ± 0.005° |
β | 102.525 ± 0.004° |
γ | 105.695 ± 0.004° |
Cell volume | 1809.9 ± 0.8 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1389 |
Residual factor for significantly intense reflections | 0.0668 |
Weighted residual factors for significantly intense reflections | 0.1424 |
Weighted residual factors for all reflections included in the refinement | 0.1727 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.998 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4500775.html
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Users of the data should acknowledge the original authors of the
structural data.