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Information card for entry 4501188
Preview
Coordinates | 4501188.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H28 Cl F6 I4 S8 |
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Calculated formula | C64 H28 Cl F6 I4 S8 |
SMILES | c1(C#Cc2c(F)c(c3c(c(c(F)c(c3F)C#Cc3ccc(cc3)C#CI)C#Cc3ccc(cc3)C#CI)F)c(c(c2F)C#Cc2ccc(cc2)C#CI)F)ccc(cc1)C#CI.C12=C(SC(S1)=C1SC3=C(S1)SCCCS3)SCCCS2.[Cl-] |
Title of publication | Halogen-Bonded, Eight-fold PtS-Type Interpenetrated Supramolecular Network. A Study toward Redundant and Cross-Bar Supramolecular Nanowire Crystal |
Authors of publication | Lieffrig, Julien; Yamamoto, Hiroshi M.; Kusamoto, Tetsuro; Cui, Henbo; Jeannin, Olivier; Fourmigué, Marc; Kato, Reizo |
Journal of publication | Crystal Growth & Design |
Year of publication | 2011 |
Journal volume | 11 |
Journal issue | 10 |
Pages of publication | 4267 |
a | 11.81 ± 0.002 Å |
b | 16.572 ± 0.003 Å |
c | 33.961 ± 0.007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6647 ± 2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 72 |
Hermann-Mauguin space group symbol | I b a m |
Hall space group symbol | -I 2 2c |
Residual factor for all reflections | 0.1846 |
Residual factor for significantly intense reflections | 0.0787 |
Weighted residual factors for significantly intense reflections | 0.2064 |
Weighted residual factors for all reflections included in the refinement | 0.2674 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.893 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4501188.html
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Users of the data should acknowledge the original authors of the
structural data.