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Information card for entry 4501567
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Coordinates | 4501567.cif |
---|---|
Original paper (by DOI) | HTML |
External links | ChemSpider |
Common name | pyrrole-phenyl-thiophene |
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Chemical name | 1,1'-(bithiophen-5,5''-diyldibenzene-4,1-diyl)bis(1H-pyrrole) |
Formula | C28 H20 N2 S2 |
Calculated formula | C28 H20 N2 S2 |
SMILES | s1c(ccc1c1ccc(cc1)n1cccc1)c1sc(cc1)c1ccc(cc1)n1cccc1 |
Title of publication | Crystal Structure and Optical Properties of N-Pyrrole End-Capped Thiophene/Phenyl Co-Oligomer: Strong H-type Excitonic Coupling and Emission Self-Waveguiding |
Authors of publication | Tavazzi, Silvia; Miozzo, Luciano; Silvestri, Leonardo; Mora, Stefano; Spearman, Peter; Moret, Massimo; Rizzato, Silvia; Braga, Daniele; Diagne Diaw, Abdou Karim; Gningue-Sall, Diariatou; Aaron, Jean-Jacques; Yassar, Abderrahim |
Journal of publication | Crystal Growth & Design |
Year of publication | 2010 |
Journal volume | 10 |
Journal issue | 5 |
Pages of publication | 2342 |
a | 5.7692 ± 0.001 Å |
b | 7.4252 ± 0.0012 Å |
c | 24.716 ± 0.004 Å |
α | 90° |
β | 91.76 ± 0.002° |
γ | 90° |
Cell volume | 1058.3 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.062 |
Residual factor for significantly intense reflections | 0.0432 |
Weighted residual factors for significantly intense reflections | 0.0938 |
Weighted residual factors for all reflections included in the refinement | 0.1026 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4501567.html
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Users of the data should acknowledge the original authors of the
structural data.