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Information card for entry 4502391
Preview
| Coordinates | 4502391.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | (S)-1-(p-chlorophenyl)ethylammonium_(Rp)-O-ethyl(p-chlrophenyl)phosphonothioate |
|---|---|
| Formula | C16 H20 Cl2 N O2 P S |
| Calculated formula | C16 H19.5 Cl2 N O2 P S |
| SMILES | [P@@]([O-])(=S)(OCC)c1ccc(Cl)cc1.Clc1ccc([C@@H]([NH3+])C)cc1 |
| Title of publication | Halogen-Bonding Interaction Stabilizing Cluster-type Diastereomeric Salt Crystals |
| Authors of publication | Kobayashi, Yuka; Maeda, Jin; Ando, Tetsuo; Saigo, Kazuhiko |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2010 |
| Journal volume | 10 |
| Journal issue | 2 |
| Pages of publication | 685 |
| a | 13.45 ± 0.0004 Å |
| b | 13.45 ± 0.0004 Å |
| c | 45.141 ± 0.0013 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8166.1 ± 0.4 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 96 |
| Hermann-Mauguin space group symbol | P 43 21 2 |
| Hall space group symbol | P 4nw 2abw |
| Residual factor for all reflections | 0.0487 |
| Residual factor for significantly intense reflections | 0.0428 |
| Weighted residual factors for significantly intense reflections | 0.1242 |
| Weighted residual factors for all reflections included in the refinement | 0.1347 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4502391.html
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