Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4502690
Preview
Coordinates | 4502690.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [4-fmbnlH]2[Cu(mal)2(H2O)2] |
---|---|
Chemical name | [4-fmbnlH]2[Cu(mal)2(H2O)2] |
Formula | C22 H26 Cu F6 N2 O10 |
Calculated formula | C22 H26 Cu F6 N2 O10 |
SMILES | C1(=O)O[Cu]2([OH2])(OC(=O)C1)(OC(=O)CC(=O)O2)[OH2].FC(F)(F)c1ccc(C[NH3+])cc1.FC(F)(F)c1ccc(C[NH3+])cc1 |
Title of publication | Crystal Engineering of a Series of Arylammonium Copper(II) Malonates |
Authors of publication | Keene, Tony D.; Zimmermann, Iwan; Neels, Antonia; Sereda, Olha; Hauser, Jürg; Liu, Shi-Xia; Decurtins, Silvio |
Journal of publication | Crystal Growth & Design |
Year of publication | 2010 |
Journal volume | 10 |
Journal issue | 4 |
Pages of publication | 1854 |
a | 11.887 ± 0.005 Å |
b | 8.328 ± 0.005 Å |
c | 13.892 ± 0.005 Å |
α | 90° |
β | 100.635 ± 0.005° |
γ | 90° |
Cell volume | 1351.6 ± 1.1 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/a 1 |
Hall space group symbol | -P 2yab |
Residual factor for all reflections | 0.0426 |
Residual factor for significantly intense reflections | 0.0309 |
Weighted residual factors for significantly intense reflections | 0.0743 |
Weighted residual factors for all reflections included in the refinement | 0.0778 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4502690.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.