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Information card for entry 4502693
Preview
Coordinates | 4502693.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [4-fpeaH]2[Cu(mal)2(H2O)2] |
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Chemical name | [4-fpeaH]2[Cu(mal)2(H2O)2] |
Formula | C22 H30 Cu F2 N2 O10 |
Calculated formula | C22 H30 Cu F2 N2 O10 |
SMILES | Fc1ccc(cc1)CC[NH3+].[Cu]12(OC(=O)CC(=O)O1)OC(=O)CC(=O)O2.O.Fc1ccc(cc1)CC[NH3+].O |
Title of publication | Crystal Engineering of a Series of Arylammonium Copper(II) Malonates |
Authors of publication | Keene, Tony D.; Zimmermann, Iwan; Neels, Antonia; Sereda, Olha; Hauser, Jürg; Liu, Shi-Xia; Decurtins, Silvio |
Journal of publication | Crystal Growth & Design |
Year of publication | 2010 |
Journal volume | 10 |
Journal issue | 4 |
Pages of publication | 1854 |
a | 13.839 ± 0.003 Å |
b | 8.4833 ± 0.0011 Å |
c | 11.722 ± 0.002 Å |
α | 90° |
β | 113.501 ± 0.015° |
γ | 90° |
Cell volume | 1262 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0888 |
Residual factor for significantly intense reflections | 0.0544 |
Weighted residual factors for significantly intense reflections | 0.1236 |
Weighted residual factors for all reflections included in the refinement | 0.1316 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.801 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4502693.html
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