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Information card for entry 4502822
Preview
Coordinates | 4502822.cif |
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Original paper (by DOI) | HTML |
Common name | 1F, p-xylene |
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Chemical name | 1,3,5-triethyl-2,4,6-tris(4-fluorophenoxy)methylbenzene, p-xylene |
Formula | C49 H53 F3 O3 |
Calculated formula | C41 H43 F3 O3 |
SMILES | O(c1ccc(F)cc1)Cc1c(c(c(c(c1CC)COc1ccc(F)cc1)CC)COc1ccc(F)cc1)CC.c1(ccccc1C)C |
Title of publication | Isostructurality in the Guest Free Forms and in the Clathrates of 1,3,5-Triethyl-2,4,6-tris(4-halophenoxy)methylbenzenes |
Authors of publication | Bhattacharya, Suman; Saha, Binoy K. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2012 |
Journal volume | 12 |
Journal issue | 1 |
Pages of publication | 169 |
a | 10.6739 ± 0.0016 Å |
b | 14.39 ± 0.002 Å |
c | 15.89 ± 0.002 Å |
α | 69.666 ± 0.014° |
β | 71.915 ± 0.013° |
γ | 77.992 ± 0.013° |
Cell volume | 2161.7 ± 0.6 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1667 |
Residual factor for significantly intense reflections | 0.0988 |
Weighted residual factors for significantly intense reflections | 0.2846 |
Weighted residual factors for all reflections included in the refinement | 0.3474 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.992 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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