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Information card for entry 4503238
Preview
Coordinates | 4503238.cif |
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Original paper (by DOI) | HTML |
Common name | C6F3I3, PPh4Br |
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Chemical name | 1,3,5-trifluoro-2,4,6-triiodobenzene, tetraphenylphosphonium bromide |
Formula | C30 H20 Br F3 I3 P |
Calculated formula | C30 H20 Br F3 I3 P |
SMILES | c1(c(c(c(c(c1F)I)F)I)F)I.[Br-].[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Halogen Bonding Interactions ofsym-Triiodotrifluorobenzene with Halide Anions: A Combined Structural and Theoretical Study |
Authors of publication | Triguero, Sonia; Llusar, Rosa; Polo, Victor; Fourmigué, Marc |
Journal of publication | Crystal Growth & Design |
Year of publication | 2008 |
Journal volume | 8 |
Journal issue | 7 |
Pages of publication | 2241 |
a | 10.3344 ± 0.0012 Å |
b | 16.9073 ± 0.0019 Å |
c | 17.618 ± 0.002 Å |
α | 90° |
β | 105.194 ± 0.006° |
γ | 90° |
Cell volume | 2970.7 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0326 |
Residual factor for significantly intense reflections | 0.0241 |
Weighted residual factors for significantly intense reflections | 0.0591 |
Weighted residual factors for all reflections included in the refinement | 0.0696 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.086 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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