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Information card for entry 4503246
Preview
Coordinates | 4503246.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H56 F16 I4 N10 |
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Calculated formula | C64 H56 F16 I4 N10 |
SMILES | C(CN(CCCNc1c(F)c(F)c(I)c(F)c1F)CCCNc1c(F)c(F)c(I)c(F)c1F)CCN(CCCNc1c(F)c(F)c(I)c(F)c1F)CCCNc1c(F)c(F)c(I)c(F)c1F.c1c(ccnc1)/C=C/c1ccncc1.c1cnccc1/C=C/c1ccncc1 |
Title of publication | Dendrimeric Tectons in Halogen Bonding-Based Crystal Engineering |
Authors of publication | Metrangolo, Pierangelo; Meyer, Franck; Pilati, Tullio; Proserpio, Davide M.; Resnati, Giuseppe |
Journal of publication | Crystal Growth & Design |
Year of publication | 2008 |
Journal volume | 8 |
Journal issue | 2 |
Pages of publication | 654 |
a | 8.6941 ± 0.0014 Å |
b | 11.932 ± 0.0018 Å |
c | 32.228 ± 0.005 Å |
α | 90° |
β | 91.43 ± 0.03° |
γ | 90° |
Cell volume | 3342.2 ± 0.9 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0596 |
Residual factor for significantly intense reflections | 0.0418 |
Weighted residual factors for significantly intense reflections | 0.1043 |
Weighted residual factors for all reflections included in the refinement | 0.1109 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.956 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4503246.html
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Users of the data should acknowledge the original authors of the
structural data.