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Information card for entry 4503426
Preview
Coordinates | 4503426.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H53 Cu2 N5 O21 P4 |
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Calculated formula | C40 H53 Cu2 N5 O21 P4 |
SMILES | c1ccc2ccc3ccc[n]4c3c2[n]1[Cu]14(OP2(=O)C3(Cc4ccccc4)NC4(Cc5ccccc5)P(=O)(O[Cu]5([n]6cccc7ccc8ccc[n]5c8c67)(OP4(=O)OP3(=O)O1)[OH2])O2)[OH2].O.O.O.O.O.O.O.O.O |
Title of publication | Newin SituCondensation Reaction of Amino Diphosphonic Acids: A Series of Bicyclic Phosphonate Derivatives and Three Novel Water Clusters |
Authors of publication | Chen, Shuo-ping; Huang, Guang-xi; Li, Ming; Pan, Ling-ling; Yuan, Yi-xuan; Yuan, Liang-jie |
Journal of publication | Crystal Growth & Design |
Year of publication | 2008 |
Journal volume | 8 |
Journal issue | 8 |
Pages of publication | 2824 |
a | 10.8584 ± 0.0006 Å |
b | 18.9394 ± 0.0011 Å |
c | 24.3047 ± 0.0014 Å |
α | 90° |
β | 92.812 ± 0.001° |
γ | 90° |
Cell volume | 4992.3 ± 0.5 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.073 |
Residual factor for significantly intense reflections | 0.0534 |
Weighted residual factors for significantly intense reflections | 0.1719 |
Weighted residual factors for all reflections included in the refinement | 0.1826 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.201 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4503426.html
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