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Information card for entry 4503533
Preview
Coordinates | 4503533.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | unknown |
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Chemical name | unknown |
Formula | C24 H20 Eu N4 Na O10 |
Calculated formula | C24 H20 Eu N4 Na O10 |
SMILES | [Eu]12345(OC(=O)c6[n]2cccc6)([O]([Na]([O]1C(=O)c1[n]5cccc1)O)C(=O)c1[n]3cccc1)OC(=O)c1[n]4cccc1.O |
Title of publication | Polymorph Selective Growth of Sodium Tetrakis(2-pyridinecarboxylato) Lanthanides and Their Structure Sensitive Properties |
Authors of publication | Hong, Jung Hoon; Oh, Yunghee; Kim, Youngmee; Kang, Sung Kwon; Choi, Jungkweon; Kim, Wan Seop; Lee, Jong In; Kim, Sung-Jin; Hur, Nam Hwi |
Journal of publication | Crystal Growth & Design |
Year of publication | 2008 |
Journal volume | 8 |
Journal issue | 4 |
Pages of publication | 1364 |
a | 12.587 ± 0.001 Å |
b | 12.587 ± 0.001 Å |
c | 58.893 ± 0.01 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 8080.5 ± 1.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 179 |
Hermann-Mauguin space group symbol | P 65 2 2 |
Hall space group symbol | P 65 2 (0 0 1) |
Residual factor for all reflections | 0.0754 |
Residual factor for significantly intense reflections | 0.0355 |
Weighted residual factors for significantly intense reflections | 0.0576 |
Weighted residual factors for all reflections included in the refinement | 0.0642 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.01 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4503533.html
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structural data.