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Information card for entry 4503932
Preview
Coordinates | 4503932.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H28 Br4 Cu N4 O4 S12 |
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Calculated formula | C24 H28 Br4 Cu N4 O4 S12 |
SMILES | C1(=C(SC(S1)=C1SC(=C(S1)SC)SC)C(=O)NC)C(=O)NC.Br[Cu](Br)([Br-])[Br-].C1(=C(SC(S1)=C1SC(=C(S1)SC)SC)C(=O)NC)C(=O)NC |
Title of publication | Tetrathiafulvalene-Diamide Salts with S···S and C···C Stacked Radical Couples |
Authors of publication | Lu, Wen; Zhu, Qin-Yu; Dai, Jie; Zhang, Yong; Bian, Guo-Qing; Liu, Yu; Zhang, De-Qing |
Journal of publication | Crystal Growth & Design |
Year of publication | 2007 |
Journal volume | 7 |
Journal issue | 4 |
Pages of publication | 652 |
a | 24.14 ± 0.003 Å |
b | 11.7092 ± 0.0012 Å |
c | 14.2102 ± 0.0017 Å |
α | 90° |
β | 98.537 ± 0.003° |
γ | 90° |
Cell volume | 3972.2 ± 0.8 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0448 |
Residual factor for significantly intense reflections | 0.0406 |
Weighted residual factors for significantly intense reflections | 0.0899 |
Weighted residual factors for all reflections included in the refinement | 0.0924 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4503932.html
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