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Information card for entry 4504982
Preview
Coordinates | 4504982.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C14 H26 N4 O12 P4 |
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Calculated formula | C14 H26 N4 O12 P4 |
SMILES | P(=O)([O-])(O)C[NH2+]CP(=O)(O)[O-].P(=O)(O)([O-])C[NH2+]CP(=O)([O-])O.[nH+]1c(cccc1)c1[nH+]cccc1 |
Title of publication | Crystal Engineered Acid‒Base Complexes with 2D and 3D Hydrogen Bonding Systems Using a Bisphosphonic Acid as the Building Block |
Authors of publication | Kong, Deyuan; McBee, Jennifer L.; Clearfield, Abraham |
Journal of publication | Crystal Growth & Design |
Year of publication | 2005 |
Journal volume | 5 |
Journal issue | 2 |
Pages of publication | 643 - 649 |
a | 10.8497 ± 0.0008 Å |
b | 12.8209 ± 0.001 Å |
c | 17.2248 ± 0.0014 Å |
α | 105.195 ± 0.001° |
β | 90.871 ± 0.001° |
γ | 98.22 ± 0.001° |
Cell volume | 2285 ± 0.3 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0482 |
Residual factor for significantly intense reflections | 0.0338 |
Weighted residual factors for significantly intense reflections | 0.0968 |
Weighted residual factors for all reflections included in the refinement | 0.1066 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4504982.html
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