Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4505828
Preview
Coordinates | 4505828.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H56 Ag4 Cl4 N8 O16 Si4 |
---|---|
Calculated formula | C48 H56 Ag4 Cl4 N8 O16 Si4 |
SMILES | [Ag]1[n]2cc([Si](c3c[n]([Ag][n]4cc([Si](c5c[n]1ccc5)(C)C)ccc4)ccc3)(C)C)ccc2.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-] |
Title of publication | “Cyclic Tetramer” vs “Dimer of Cyclic Dimer”: Subtle Anion Effects on the Cyclization of AgBF4vs AgClO4with Bis(3-pyridyl)dimethylsilane |
Authors of publication | Jung, Ok-Sang; Lee, Young-A; Kim, Yun Ju; Hong, Jongki |
Journal of publication | Crystal Growth & Design |
Year of publication | 2002 |
Journal volume | 2 |
Journal issue | 6 |
Pages of publication | 497 |
a | 12.5075 ± 0.0002 Å |
b | 32.3068 ± 0.0007 Å |
c | 15.6988 ± 0.0003 Å |
α | 90° |
β | 101.081 ± 0.0011° |
γ | 90° |
Cell volume | 6225.3 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1124 |
Residual factor for significantly intense reflections | 0.0637 |
Weighted residual factors for significantly intense reflections | 0.1716 |
Weighted residual factors for all reflections included in the refinement | 0.2206 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4505828.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.