Information card for entry 4506301
| Common name |
HMX - thieno[3,2-b]thiophene |
| Chemical name |
1,3,5,7-tetranitro-1,3,5,7-tetraza-cyclooctane - thieno[3,2-b]thiophene |
| Formula |
C10 H12 N8 O8 S2 |
| Calculated formula |
C10 H12 N8 O8 S2 |
| SMILES |
C1N(N(=O)=O)CN(CN(CN1N(=O)=O)N(=O)=O)N(=O)=O.c1cc2c(s1)ccs2 |
| Title of publication |
Cocrystals of 1,3,5,7-Tetranitro-1,3,5,7-tetrazacyclooctane (HMX) |
| Authors of publication |
Landenberger, Kira B.; Matzger, Adam J. |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2012 |
| Journal volume |
12 |
| Journal issue |
7 |
| Pages of publication |
3603 |
| a |
11.1402 ± 0.0005 Å |
| b |
19.1745 ± 0.0014 Å |
| c |
7.6902 ± 0.0003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1642.69 ± 0.15 Å3 |
| Cell temperature |
95 ± 2 K |
| Ambient diffraction temperature |
95 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
62 |
| Hermann-Mauguin space group symbol |
P n m a |
| Hall space group symbol |
-P 2ac 2n |
| Residual factor for all reflections |
0.0376 |
| Residual factor for significantly intense reflections |
0.0356 |
| Weighted residual factors for significantly intense reflections |
0.0977 |
| Weighted residual factors for all reflections included in the refinement |
0.1012 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.096 |
| Diffraction radiation wavelength |
1.54187 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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