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Information card for entry 4506954
Preview
Coordinates | 4506954.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | 1,2,4,5-tetrakis-perfluorobutyl-benzene |
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Formula | C22 H2 F36 |
Calculated formula | C22 H2 F36 |
SMILES | c1c(C(C(C(F)(C(F)(F)F)F)(F)F)(F)F)c(cc(C(C(C(F)(C(F)(F)F)F)(F)F)(F)F)c1C(F)(C(C(C(F)(F)F)(F)F)(F)F)F)C(C(C(C(F)(F)F)(F)F)(F)F)(F)F |
Title of publication | Strengthening π‒π Interactions While Suppressing Csp2‒H···π (T-Shaped) Interactions via Perfluoroalkylation: A Crystallographic and Computational Study That Supports the Beneficial Formation of 1-D π‒π Stacked Aromatic Materials |
Authors of publication | Sun, Haoran; Tottempudi, Usha K.; Mottishaw, Jeffery D.; Basa, Prem N.; Putta, Anjaneyulu; Sykes, Andrew G. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2012 |
Journal volume | 12 |
Journal issue | 11 |
Pages of publication | 5655 |
a | 12.777 ± 0.003 Å |
b | 10.638 ± 0.002 Å |
c | 21.391 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2907.5 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 3 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0779 |
Residual factor for significantly intense reflections | 0.0738 |
Weighted residual factors for significantly intense reflections | 0.1692 |
Weighted residual factors for all reflections included in the refinement | 0.1711 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.317 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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