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Information card for entry 4509857
Preview
| Coordinates | 4509857.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H10 F6 N3 Ta |
|---|---|
| Calculated formula | C10 H10 F6 N3 Ta |
| SMILES | N(c1[nH+]cccc1)c1ncccc1.[Ta](F)(F)(F)(F)(F)[F-] |
| Title of publication | Specific Chemistry of the Anions: [TaOF5]2‒, [TaF6]−, and [TaF7]2‒ |
| Authors of publication | Lu, Hongcheng; Gautier, Romain; Donakowski, Martin D.; Fuoco, Lindsay; Liu, Zhengtang; Poeppelmeier, Kenneth R. |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2014 |
| Journal volume | 14 |
| Journal issue | 2 |
| Pages of publication | 844 |
| a | 8.9303 ± 0.0003 Å |
| b | 17.7866 ± 0.0006 Å |
| c | 7.9821 ± 0.0003 Å |
| α | 90° |
| β | 96.7172 ± 0.0016° |
| γ | 90° |
| Cell volume | 1259.17 ± 0.08 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0163 |
| Residual factor for significantly intense reflections | 0.0157 |
| Weighted residual factors for significantly intense reflections | 0.0358 |
| Weighted residual factors for all reflections included in the refinement | 0.036 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4509857.html
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Users of the data should acknowledge the original authors of the
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