Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4510558
Preview
Coordinates | 4510558.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H44 N4 O20 P4 |
---|---|
Calculated formula | C24 H44 N4 O20 P4 |
SMILES | P(=O)(O)(O)[O-].P(=O)(O)([O-])O.P(=O)(O)([O-])O.P(=O)([O-])(O)O.O(c1ccc([NH3+])cc1)CC[NH+](CCOc1ccc([NH3+])cc1)CCOc1ccc([NH3+])cc1.O |
Title of publication | Cationic Tripodal Receptor Assisted Formation of Anion and Anion‒Water Clusters: Structural Interpretation of Dihydrogen Phosphate Cluster and Sulfate‒Water Tetramer [(SO4)2‒(H2O)2]4‒ |
Authors of publication | Hoque, Md. Najbul; Das, Gopal |
Journal of publication | Crystal Growth & Design |
Year of publication | 2014 |
Journal volume | 14 |
Journal issue | 6 |
Pages of publication | 2962 |
a | 12.8225 ± 0.0008 Å |
b | 13.3153 ± 0.0007 Å |
c | 13.7615 ± 0.0009 Å |
α | 65.496 ± 0.006° |
β | 64.074 ± 0.007° |
γ | 61.25 ± 0.006° |
Cell volume | 1789.3 ± 0.2 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0705 |
Residual factor for significantly intense reflections | 0.0545 |
Weighted residual factors for significantly intense reflections | 0.1604 |
Weighted residual factors for all reflections included in the refinement | 0.1864 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.787 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4510558.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.