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Information card for entry 4510604
Preview
Coordinates | 4510604.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C33 H38 Cl2 N2 O4 |
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Calculated formula | C33 H38 Cl2 N2 O4 |
Title of publication | Growth and alignment of thin film organic single crystals from dewetting patterns. |
Authors of publication | Tisserant, Jean-Nicolas; Wicht, Gaëtan; Göbel, Ole F; Bocek, Eva; Bona, Gian-Luca; Geiger, Thomas; Hany, Roland; Mezzenga, Raffaele; Partel, Stefan; Schmid, Peter; Schweizer, Wolfhard Bernd; Heier, Jakob |
Journal of publication | ACS nano |
Year of publication | 2013 |
Journal volume | 7 |
Journal issue | 6 |
Pages of publication | 5506 - 5513 |
a | 23.9162 ± 0.0007 Å |
b | 16.8152 ± 0.0006 Å |
c | 15.658 ± 0.0006 Å |
α | 90° |
β | 92.811 ± 0.001° |
γ | 90° |
Cell volume | 6289.4 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.106 |
Residual factor for significantly intense reflections | 0.0733 |
Weighted residual factors for significantly intense reflections | 0.2063 |
Weighted residual factors for all reflections included in the refinement | 0.2259 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.466 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/4510604.html
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