Information card for entry 4510604
| Formula |
C33 H38 Cl2 N2 O4 |
| Calculated formula |
C33 H38 Cl2 N2 O4 |
| Title of publication |
Growth and alignment of thin film organic single crystals from dewetting patterns. |
| Authors of publication |
Tisserant, Jean-Nicolas; Wicht, Gaëtan; Göbel, Ole F; Bocek, Eva; Bona, Gian-Luca; Geiger, Thomas; Hany, Roland; Mezzenga, Raffaele; Partel, Stefan; Schmid, Peter; Schweizer, Wolfhard Bernd; Heier, Jakob |
| Journal of publication |
ACS nano |
| Year of publication |
2013 |
| Journal volume |
7 |
| Journal issue |
6 |
| Pages of publication |
5506 - 5513 |
| a |
23.9162 ± 0.0007 Å |
| b |
16.8152 ± 0.0006 Å |
| c |
15.658 ± 0.0006 Å |
| α |
90° |
| β |
92.811 ± 0.001° |
| γ |
90° |
| Cell volume |
6289.4 ± 0.4 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.106 |
| Residual factor for significantly intense reflections |
0.0733 |
| Weighted residual factors for significantly intense reflections |
0.2063 |
| Weighted residual factors for all reflections included in the refinement |
0.2259 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.466 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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