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Information card for entry 4510822
Preview
Coordinates | 4510822.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H62 Cl2 N2 O10 |
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Calculated formula | C52 H62 Cl2 N2 O10 |
SMILES | C(=O)(C(c1ccccc1)(c1ccccc1)O)O[C@H]1C[C@H]2[N+]3([C@H](CC2)C1)CCCC3.C(=O)(C(=O)O)O.[Cl-].C(=O)(C(c1ccccc1)(c1ccccc1)O)O[C@H]1C[C@H]2[N+]3([C@H](CC2)C1)CCCC3.[Cl-] |
Title of publication | Application and Comparison of Cocrystallization Techniques on Trospium Chloride Cocrystals |
Authors of publication | Sládková, Veronika; Cibulková, Jana; Eigner, Václav; Šturc, Antonín; Kratochvíl, Bohumil; Rohlíček, Jan |
Journal of publication | Crystal Growth & Design |
Year of publication | 2014 |
Journal volume | 14 |
Journal issue | 6 |
Pages of publication | 2931 |
a | 43.4462 ± 0.0007 Å |
b | 6.61949 ± 0.0001 Å |
c | 16.5083 ± 0.0002 Å |
α | 90° |
β | 99.7909 ± 0.0014° |
γ | 90° |
Cell volume | 4678.5 ± 0.12 Å3 |
Cell temperature | 190 K |
Ambient diffraction temperature | 190 K |
Ambient diffracton pressure | 101 kPa |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0428 |
Residual factor for significantly intense reflections | 0.0403 |
Weighted residual factors for all reflections | 0.1221 |
Weighted residual factors for significantly intense reflections | 0.1174 |
Weighted residual factors for all reflections included in the refinement | 0.1221 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9214 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4510822.html
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Users of the data should acknowledge the original authors of the
structural data.