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Information card for entry 4510946
Preview
| Coordinates | 4510946.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H12 B F5 N6 O |
|---|---|
| Calculated formula | C30 H12 B F5 N6 O |
| SMILES | Fc1c(O[B]23[n]4c5=Nc6n3c(N=c3n2c(=Nc4c2c5cccc2)c2ccccc32)c2ccccc62)c(F)c(F)c(F)c1F |
| Title of publication | Fluorinated Phenoxy Boron Subphthalocyanines in Organic Light-Emitting Diodes |
| Authors of publication | Morse, Graham E.; Helander, Michael G.; Maka, Jozef F.; Lu, Zheng-Hong; Bender, Timothy P. |
| Journal of publication | ACS Applied Materials & Interfaces |
| Year of publication | 2010 |
| Journal volume | 2 |
| Journal issue | 7 |
| Pages of publication | 1934 |
| a | 19.7225 ± 0.0004 Å |
| b | 10.3637 ± 0.0003 Å |
| c | 23.4591 ± 0.0006 Å |
| α | 90° |
| β | 93.387 ± 0.0015° |
| γ | 90° |
| Cell volume | 4786.6 ± 0.2 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0674 |
| Residual factor for significantly intense reflections | 0.0432 |
| Weighted residual factors for significantly intense reflections | 0.1048 |
| Weighted residual factors for all reflections included in the refinement | 0.1205 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4510946.html
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