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Information card for entry 4511014
Preview
Coordinates | 4511014.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C114 H165 N12 O28.5 |
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Calculated formula | C114 H165 N12 O28.5 |
Title of publication | Structural Study of Triazole and Amide Containing Anion-Templated Pseudorotaxanes |
Authors of publication | White, Nicholas G.; Serpell, Christopher J.; Beer, Paul D. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2014 |
Journal volume | 14 |
Journal issue | 7 |
Pages of publication | 3472 |
a | 10.911 ± 0.0002 Å |
b | 34.4444 ± 0.0004 Å |
c | 16.7589 ± 0.0003 Å |
α | 90° |
β | 95.8673 ± 0.0018° |
γ | 90° |
Cell volume | 6265.38 ± 0.18 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.1148 |
Residual factor for significantly intense reflections | 0.1016 |
Weighted residual factors for all reflections | 0.2394 |
Weighted residual factors for significantly intense reflections | 0.2169 |
Weighted residual factors for all reflections included in the refinement | 0.2388 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.0478 |
Diffraction radiation wavelength | 0.6889 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4511014.html
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Users of the data should acknowledge the original authors of the
structural data.