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Information card for entry 4511443
Preview
Coordinates | 4511443.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H65 N17 O22 |
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Calculated formula | C54 H65 N17 O22 |
SMILES | [O-]c1c(N(=O)=O)cc(N(=O)=O)cc1N(=O)=O.O=N(=O)c1cc(N(=O)=O)c([O-])c(c1)N(=O)=O.N1Cc2ccc(cc2)CNCC[NH+]2CCNCc3ccc(C[NH2+]CCN(CC1)CC[NH2+]Cc1ccc(CNCC2)cc1)cc3.[O-]c1c(N(=O)=O)cc(cc1N(=O)=O)N(=O)=O.O |
Title of publication | Recognition of Water−Acetonitrile−Water Cluster in a Tetraprotonated Picrate Salt of Octaaminocryptand |
Authors of publication | Ravikumar, I.; Lakshminarayanan, P. S.; Suresh, Eringathodi; Ghosh, Pradyut |
Journal of publication | Crystal Growth & Design |
Year of publication | 2006 |
Journal volume | 6 |
Journal issue | 12 |
Pages of publication | 2630 |
a | 12.9979 ± 0.0011 Å |
b | 16.3568 ± 0.0013 Å |
c | 17.6387 ± 0.0015 Å |
α | 100.161 ± 0.002° |
β | 108.258 ± 0.002° |
γ | 111.232 ± 0.002° |
Cell volume | 3136.5 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1177 |
Residual factor for significantly intense reflections | 0.0731 |
Weighted residual factors for significantly intense reflections | 0.1792 |
Weighted residual factors for all reflections included in the refinement | 0.2079 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.976 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4511443.html
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Users of the data should acknowledge the original authors of the
structural data.