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Information card for entry 4512074
Preview
| Coordinates | 4512074.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | UiO-66 |
|---|---|
| Chemical name | Zr(IV) terephthalate metal-organic framework |
| Formula | C34.32 H17.14 O32.02 Zr6 |
| Calculated formula | C34.272 H17.136 O32 Zr6 |
| Title of publication | Detailed Structure Analysis of Atomic Positions and Defects in Zirconium Metal‒Organic Frameworks |
| Authors of publication | Øien, Sigurd; Wragg, David; Reinsch, Helge; Svelle, Stian; Bordiga, Silvia; Lamberti, Carlo; Lillerud, Karl Petter |
| Journal of publication | Crystal Growth & Design |
| Year of publication | 2014 |
| Journal volume | 14 |
| Journal issue | 11 |
| Pages of publication | 5370 |
| a | 20.7465 ± 0.0002 Å |
| b | 20.7465 ± 0.0002 Å |
| c | 20.7465 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8929.65 ± 0.15 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 225 |
| Hermann-Mauguin space group symbol | F m -3 m |
| Hall space group symbol | -F 4 2 3 |
| Residual factor for all reflections | 0.0207 |
| Residual factor for significantly intense reflections | 0.0198 |
| Weighted residual factors for significantly intense reflections | 0.0601 |
| Weighted residual factors for all reflections included in the refinement | 0.0603 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.155 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.76 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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