Information card for entry 4512128
| Formula |
Cd0.54 Cs2 Hg5.46 S7 |
| Calculated formula |
Cd0.54 Cs2 Hg5.46 S7 |
| Title of publication |
Investigation of Semi-Insulating Cs2Hg6S7and Cs2Hg6-xCdxS7Alloy for Hard Radiation Detection |
| Authors of publication |
Li, Hao; Malliakas, Christos D.; Liu, Zhifu; Peters, John A.; Sebastian, Maria; Zhao, Lidong; Chung, Duck Young; Wessels, Bruce W.; Kanatzidis, Mercouri G. |
| Journal of publication |
Crystal Growth & Design |
| Year of publication |
2014 |
| Journal volume |
14 |
| Journal issue |
11 |
| Pages of publication |
5949 |
| a |
13.968 ± 0.002 Å |
| b |
13.968 ± 0.002 Å |
| c |
4.1551 ± 0.0008 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
810.7 ± 0.2 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
102 |
| Hermann-Mauguin space group symbol |
P 42 n m |
| Hall space group symbol |
P 4n -2n |
| Residual factor for all reflections |
0.029 |
| Residual factor for significantly intense reflections |
0.0268 |
| Weighted residual factors for significantly intense reflections |
0.0602 |
| Weighted residual factors for all reflections included in the refinement |
0.0644 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.026 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4512128.html
