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Information card for entry 4512395
Preview
Coordinates | 4512395.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H52 Hg2 I4 O6 S4 |
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Calculated formula | C42 H52 Hg2 I4 O6 S4 |
SMILES | c12ccccc1C[S]1CCOCC[S](Cc3ccccc3OCCCO2)[Hg](I)(I)[S]2Cc3c(cccc3)OCCCOc3c(C[S]([Hg]1(I)I)CCOCC2)cccc3 |
Title of publication | Supramolecular Silver(I), Copper(I), and Mercury(II) Complexes with Thiamacrocycles Exhibiting Different Types of Endo- or Exocoordination Modes: From Monomer and Dimer to One-Dimensional and Two-Dimensional Polymers |
Authors of publication | Kim, Hyun Jee; Park, In-Hyeok; Lee, Ji-Eun; Park, Ki-Min; Lee, Shim Sung |
Journal of publication | Crystal Growth & Design |
Year of publication | 2014 |
Journal volume | 14 |
Journal issue | 12 |
Pages of publication | 6269 |
a | 8.7385 ± 0.0007 Å |
b | 11.8613 ± 0.0009 Å |
c | 13.8704 ± 0.0011 Å |
α | 108.661 ± 0.001° |
β | 91.514 ± 0.001° |
γ | 109.843 ± 0.001° |
Cell volume | 1266.42 ± 0.17 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0234 |
Residual factor for significantly intense reflections | 0.021 |
Weighted residual factors for significantly intense reflections | 0.051 |
Weighted residual factors for all reflections included in the refinement | 0.052 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4512395.html
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