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Information card for entry 4512411
Preview
Coordinates | 4512411.cif |
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Original paper (by DOI) | HTML |
Common name | C60 . 2 S8 (delta, 90 K) |
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Formula | C60 S16 |
Calculated formula | C60 S16 |
SMILES | S1SSSSSSS1.S1SSSSSSS1.c12c3c4c5c6c1c1c7c2c2c8c3c3c4c4c9c5c5c6c6c1c1c%10c7c7c2c2c8c8c3c3c4c4c9c9c5c5c6c1c1c6c%10c7c7c2c2c8c3c3c4c4c9c5c1c1c6c7c2c3c41 |
Title of publication | New Insights into the Structural Complexity of C60·2S8: Two Crystal Morphologies, Two Phase Changes, Four Polymorphs |
Authors of publication | Ghiassi, Kamran B.; Chen, Susanne Y.; Wescott, Joseph; Balch, Alan L.; Olmstead, Marilyn M. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 1 |
Pages of publication | 404 |
a | 16.1355 ± 0.0006 Å |
b | 15.7332 ± 0.0006 Å |
c | 18.3535 ± 0.0007 Å |
α | 90° |
β | 113.283 ± 0.002° |
γ | 90° |
Cell volume | 4279.8 ± 0.3 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 2 |
Space group number | 7 |
Hermann-Mauguin space group symbol | P 1 c 1 |
Hall space group symbol | P -2yc |
Residual factor for all reflections | 0.0274 |
Residual factor for significantly intense reflections | 0.0269 |
Weighted residual factors for significantly intense reflections | 0.0728 |
Weighted residual factors for all reflections included in the refinement | 0.0732 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4512411.html
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Users of the data should acknowledge the original authors of the
structural data.