Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4512474
Preview
Coordinates | 4512474.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Na3Ba2B6O12F |
---|---|
Formula | B6 Ba2 F Na3 O12 |
Calculated formula | B6 Ba2 F Na3 O12 |
SMILES | B1(OB(OB(O1)[O-])[O-])[O-].[Na+].[F-].[Ba+2].B1(OB(OB(O1)[O-])[O-])[O-].[Ba+2].[Na+].[Na+] |
Title of publication | Na3Ba2(B3O6)2F: Next Generation of Deep-Ultraviolet Birefringent Materials |
Authors of publication | Zhang, Hui; Zhang, Min; Pan, Shilie; Yang, Zhihua; Wang, Zheng; Bian, Qiang; Hou, Xueling; Yu, Hongwei; Zhang, Fangfang; Wu, Kui; Yang, Feng; Peng, Qinjun; Xu, Zuyan; Chang, Kelvin B.; Poeppelmeier, Kenneth R. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 1 |
Pages of publication | 523 |
a | 7.3489 ± 0.001 Å |
b | 7.3489 ± 0.001 Å |
c | 12.642 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 591.3 ± 0.2 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 176 |
Hermann-Mauguin space group symbol | P 63/m |
Hall space group symbol | -P 6c |
Residual factor for all reflections | 0.0128 |
Residual factor for significantly intense reflections | 0.0124 |
Weighted residual factors for significantly intense reflections | 0.0285 |
Weighted residual factors for all reflections included in the refinement | 0.0286 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.226 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4512474.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.