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Information card for entry 4512693
Preview
Coordinates | 4512693.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C41.5 H37.5 Cl1.5 N5 O8 S2 |
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Calculated formula | C41.5 H37.5 Cl1.5 N5 O8 S2 |
SMILES | S(=O)(=O)(Nc1c(C#Cc2nc(ccc2)C#Cc2c(NS(=O)(=O)c3ccc(N(=O)=O)cc3)ccc(c2)C(C)(C)C)cc(cc1)C(C)(C)C)c1ccc(N(=O)=O)cc1.C(Cl)(Cl)Cl |
Title of publication | Solid-State Examination of Conformationally Diverse Sulfonamide Receptors Based on Bis(2-anilinoethynyl)pyridine, -Bipyridine, and -Thiophene. |
Authors of publication | Berryman, Orion B.; Johnson, 2nd, Charles A; Vonnegut, Chris L.; Fajardo, Kevin A.; Zakharov, Lev N.; Johnson, Darren W.; Haley, Michael M. |
Journal of publication | Crystal growth & design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 3 |
Pages of publication | 1502 - 1511 |
a | 27.226 ± 0.004 Å |
b | 20.765 ± 0.003 Å |
c | 31.191 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 17634 ± 4 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153.15 K |
Number of distinct elements | 6 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.1251 |
Residual factor for significantly intense reflections | 0.0782 |
Weighted residual factors for significantly intense reflections | 0.2096 |
Weighted residual factors for all reflections included in the refinement | 0.2351 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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