Information card for entry 4512698
| Formula |
C48 H46 N4 O4 S2 |
| Calculated formula |
C48 H46 N4 O4 S2 |
| SMILES |
c1(ccc(cc1C#Cc1nc(ccc1)c1nc(C#Cc2c(ccc(c2)C(C)(C)C)NS(=O)(=O)c2ccc(C)cc2)ccc1)C(C)(C)C)NS(=O)(=O)c1ccc(C)cc1 |
| Title of publication |
Solid-State Examination of Conformationally Diverse Sulfonamide Receptors Based on Bis(2-anilinoethynyl)pyridine, -Bipyridine, and -Thiophene. |
| Authors of publication |
Berryman, Orion B.; Johnson, 2nd, Charles A; Vonnegut, Chris L.; Fajardo, Kevin A.; Zakharov, Lev N.; Johnson, Darren W.; Haley, Michael M. |
| Journal of publication |
Crystal growth & design |
| Year of publication |
2015 |
| Journal volume |
15 |
| Journal issue |
3 |
| Pages of publication |
1502 - 1511 |
| a |
7.96 ± 0.003 Å |
| b |
10.86 ± 0.004 Å |
| c |
12.852 ± 0.004 Å |
| α |
101.699 ± 0.007° |
| β |
97.68 ± 0.007° |
| γ |
95.72 ± 0.006° |
| Cell volume |
1068.9 ± 0.7 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0985 |
| Residual factor for significantly intense reflections |
0.0611 |
| Weighted residual factors for significantly intense reflections |
0.1297 |
| Weighted residual factors for all reflections included in the refinement |
0.1538 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.041 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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