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Information card for entry 4512698
Preview
Coordinates | 4512698.cif |
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Original paper (by DOI) | HTML |
Formula | C48 H46 N4 O4 S2 |
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Calculated formula | C48 H46 N4 O4 S2 |
SMILES | c1(ccc(cc1C#Cc1nc(ccc1)c1nc(C#Cc2c(ccc(c2)C(C)(C)C)NS(=O)(=O)c2ccc(C)cc2)ccc1)C(C)(C)C)NS(=O)(=O)c1ccc(C)cc1 |
Title of publication | Solid-State Examination of Conformationally Diverse Sulfonamide Receptors Based on Bis(2-anilinoethynyl)pyridine, -Bipyridine, and -Thiophene. |
Authors of publication | Berryman, Orion B.; Johnson, 2nd, Charles A; Vonnegut, Chris L.; Fajardo, Kevin A.; Zakharov, Lev N.; Johnson, Darren W.; Haley, Michael M. |
Journal of publication | Crystal growth & design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 3 |
Pages of publication | 1502 - 1511 |
a | 7.96 ± 0.003 Å |
b | 10.86 ± 0.004 Å |
c | 12.852 ± 0.004 Å |
α | 101.699 ± 0.007° |
β | 97.68 ± 0.007° |
γ | 95.72 ± 0.006° |
Cell volume | 1068.9 ± 0.7 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0985 |
Residual factor for significantly intense reflections | 0.0611 |
Weighted residual factors for significantly intense reflections | 0.1297 |
Weighted residual factors for all reflections included in the refinement | 0.1538 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4512698.html
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