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Information card for entry 4513016
Preview
Coordinates | 4513016.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C18 H22 N8 O8 S4 Se |
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Calculated formula | C18 H22 N8 O8 S4 Se |
SMILES | [Se](=O)(=O)([O-])[O-].S1C(=NNC1=NS(=O)(=O)c1ccc([NH3+])cc1)C.S(=O)(=O)(N=C1SC(=NN1)C)c1ccc([NH3+])cc1 |
Title of publication | “Conformational Simulation” of Sulfamethizole by Molecular Complexation and Insights from Charge Density Analysis: Role of Intramolecular S···O Chalcogen Bonding |
Authors of publication | Thomas, Sajesh P.; Veccham, Srimukh Prasad K. P.; Farrugia, Louis J.; Guru Row, T. N. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 5 |
Pages of publication | 2110 |
a | 5.8358 ± 0.0005 Å |
b | 14.2437 ± 0.0014 Å |
c | 16.2986 ± 0.0017 Å |
α | 81.747 ± 0.008° |
β | 81.388 ± 0.008° |
γ | 79.17 ± 0.008° |
Cell volume | 1306.3 ± 0.2 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.089 |
Residual factor for significantly intense reflections | 0.0622 |
Weighted residual factors for significantly intense reflections | 0.1365 |
Weighted residual factors for all reflections included in the refinement | 0.1574 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.0645 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4513016.html
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