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Information card for entry 4513178
Preview
Coordinates | 4513178.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Bis carbon tetrachloride tetrakis-(4-iodophenyl)ethylene |
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Formula | C28 H16 Cl8 I4 |
Calculated formula | C28 H16 Cl8 I4 |
SMILES | C(=C(c1ccc(cc1)I)c1ccc(cc1)I)(c1ccc(cc1)I)c1ccc(cc1)I.C(Cl)(Cl)(Cl)Cl.C(Cl)(Cl)(Cl)Cl |
Title of publication | Halogen Bonding in Host‒Guest Compounds: Structures and Kinetics of Enclathration and Desolvation |
Authors of publication | Amombo Noa, Francoise M.; Bourne, Susan A.; Nassimbeni, Luigi R. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 7 |
Pages of publication | 3271 |
a | 18.949 ± 0.0013 Å |
b | 10.3422 ± 0.0007 Å |
c | 17.9428 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3516.3 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 4 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.0506 |
Residual factor for significantly intense reflections | 0.031 |
Weighted residual factors for significantly intense reflections | 0.0589 |
Weighted residual factors for all reflections included in the refinement | 0.0668 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.007 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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