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Information card for entry 4513272
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Coordinates | 4513272.cif |
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Original paper (by DOI) | HTML |
Common name | Sulfamethizole-vanillic acid cocrystal |
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Chemical name | 4-Amino-N-methyl-3H-1,3,4-thiadiazol-2-ylidene-benzenesulfonamide-3-methoxy-4-hydroxy-benzoicacid |
Formula | C17 H18 N4 O6 S2 |
Calculated formula | C17 H18 N4 O6 S2 |
SMILES | S(=O)(=O)(N=c1sc(n[nH]1)C)c1ccc(N)cc1.OC(=O)c1ccc(O)c(OC)c1 |
Title of publication | Novel Synthons in Sulfamethizole Cocrystals: Structure‒Property Relations and Solubility |
Authors of publication | Suresh, Kuthuru; Minkov, Vasily S.; Namila, Kranthi Kumar; Derevyannikova, Elizaveta; Losev, Evgeniy; Nangia, Ashwini; Boldyreva, Elena V. |
Journal of publication | Crystal Growth & Design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 7 |
Pages of publication | 3498 |
a | 8.1263 ± 0.0005 Å |
b | 19.7763 ± 0.0007 Å |
c | 12.0584 ± 0.0007 Å |
α | 90° |
β | 109.396 ± 0.004° |
γ | 90° |
Cell volume | 1827.9 ± 0.17 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.036 |
Residual factor for significantly intense reflections | 0.0292 |
Weighted residual factors for significantly intense reflections | 0.0682 |
Weighted residual factors for all reflections included in the refinement | 0.0707 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.