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Information card for entry 4513579
Preview
Coordinates | 4513579.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | As4 O6 |
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Calculated formula | As4 O6 |
SMILES | O1[As]2O[As]3O[As]1O[As](O2)O3 |
Title of publication | Compressed Arsenolite As4O6and Its Helium Clathrate As4O6·2He |
Authors of publication | Guńka, Piotr A.; Dziubek, Kamil F.; Gładysiak, Andrzej; Dranka, Maciej; Piechota, Jacek; Hanfland, Michael; Katrusiak, Andrzej; Zachara, Janusz |
Journal of publication | Crystal Growth & Design |
Year of publication | 2015 |
Journal volume | 15 |
Journal issue | 8 |
Pages of publication | 3740 |
a | 9.7729 ± 0.0004 Å |
b | 9.7729 ± 0.0004 Å |
c | 9.7729 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 933.41 ± 0.07 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Cell measurement pressure | 17590000 ± 50000 kPa |
Ambient diffracton pressure | 17590000 ± 50000 kPa |
Number of distinct elements | 2 |
Space group number | 227 |
Hermann-Mauguin space group symbol | F d -3 m :2 |
Hall space group symbol | -F 4vw 2vw 3 |
Residual factor for all reflections | 0.0342 |
Residual factor for significantly intense reflections | 0.0332 |
Weighted residual factors for significantly intense reflections | 0.092 |
Weighted residual factors for all reflections included in the refinement | 0.0933 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.31 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.41427 Å |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4513579.html
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