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Information card for entry 4513965
Preview
Coordinates | 4513965.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H28 I2 N6 O4 |
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Calculated formula | C28 H28 I2 N6 O4 |
SMILES | c1n(cc[n+]1C)CCCN1C(=O)c2c3c(C1=O)ccc1C(=O)N(CCCn4c[n+](cc4)C)C(=O)c(c31)cc2.[I-].[I-] |
Title of publication | Anion-Exchange Induced Strong π-π Interactions in Single Crystalline Naphthalene Diimide for Nitroexplosive Sensing: An Electronic Prototype for Visual on-Site Detection. |
Authors of publication | Kalita, Anamika; Hussain, Sameer; Malik, Akhtar Hussain; Barman, Ujjwol; Goswami, Namami; Iyer, Parameswar Krishnan |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2016 |
Journal volume | 8 |
Journal issue | 38 |
Pages of publication | 25326 - 25336 |
a | 8.0011 ± 0.0006 Å |
b | 13.7926 ± 0.001 Å |
c | 13.685 ± 0.001 Å |
α | 90° |
β | 103.864 ± 0.005° |
γ | 90° |
Cell volume | 1466.22 ± 0.19 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1042 |
Residual factor for significantly intense reflections | 0.0398 |
Weighted residual factors for significantly intense reflections | 0.0721 |
Weighted residual factors for all reflections included in the refinement | 0.0789 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.883 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4513965.html
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