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Information card for entry 4514467
Preview
Coordinates | 4514467.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | Al4.51 Eu0.41 La3.19 Li N27.28 O2.12 Si15.29 |
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Calculated formula | Al4.511 Eu0.4131 La3.1854 Li N27.2816 O2.1199 Si15.2921 |
Title of publication | New Deep-Blue-Emitting Ce-Doped A<sub>4-<i>m</i></sub>B<sub> <i>n</i> </sub>C<sub>19+2<i>m</i></sub>X<sub>29+<i>m</i></sub> (A = Sr, La; B = Li; C = Si, Al; X = O, N; 0 ≤ <i>m</i> ≤ 1; 0 ≤ <i>n</i> ≤ 1) Phosphors for High-Color-Rendering Warm White Light-Emitting Diodes. |
Authors of publication | Wang, Chun-Yun; Takeda, Takashi; Melvin Ten Kate, Otmar; Funahashi, Shiro; Xie, Rong-Jun; Takahashi, Kohsei; Hirosaki, Naoto |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2019 |
Journal volume | 11 |
Journal issue | 32 |
Pages of publication | 29047 - 29055 |
a | 12.168 ± 0.0006 Å |
b | 12.168 ± 0.0006 Å |
c | 4.829 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 619.19 ± 0.06 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 156 |
Hermann-Mauguin space group symbol | P 3 m 1 |
Hall space group symbol | P 3 -2" |
Residual factor for all reflections | 0.0302 |
Residual factor for significantly intense reflections | 0.0282 |
Weighted residual factors for all reflections included in the refinement | 0.067 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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