Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4514516
Preview
Coordinates | 4514516.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H57 N3 O |
---|---|
Calculated formula | C56 H57 N3 O |
SMILES | O=C(c1cc(n2c3ccc(C(C)(C)C)cc3c3cc(ccc23)C(C)(C)C)cc(n2c3c(cc(C(C)(C)C)cc3)c3c2ccc(C(C)(C)C)c3)c1)c1nc2ccccc2cc1 |
Title of publication | Quinolinylmethanone-Based Thermally Activated Delayed Fluorescence Emitters and the Application in OLEDs: Effect of Intramolecular H-Bonding. |
Authors of publication | Thangaraji, Vasudevan; Rajamalli, Pachaiyappan; Jayakumar, Jayachandran; Huang, Min-Jie; Chen, Yu-Wei; Cheng, Chien-Hong |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2019 |
Journal volume | 11 |
Journal issue | 19 |
Pages of publication | 17128 - 17133 |
a | 23.862 ± 0.003 Å |
b | 18.116 ± 0.002 Å |
c | 10.8546 ± 0.0012 Å |
α | 90° |
β | 95.756 ± 0.004° |
γ | 90° |
Cell volume | 4668.6 ± 0.9 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1227 |
Residual factor for significantly intense reflections | 0.0592 |
Weighted residual factors for significantly intense reflections | 0.1109 |
Weighted residual factors for all reflections included in the refinement | 0.1329 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4514516.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.