Information card for entry 4514532

Structure parameters

• Formula: C40 H40 Br2 N2 O Pt Si2
• Calculated formula: C40 H40 Br2 N2 O Pt Si2
• SMILES: [Pt]1([n]2cc(C#C[Si](C)(C)C)ccc2c2[n]1cc(C#C[Si](C)(C)C)cc2)(C#Cc1cc(Br)ccc1)C#Cc1cccc(c1)Br.O1CCCC1
• Title of publication: Facile and Equipment-Free Data Encryption and Decryption by Self-Encrypting Pt(II) Complex.
• Authors of publication: Kang, Jiajia; Ni, Jun; Su, Mengmeng; Li, Yanqin; Zhang, Jianjun; Zhou, Huajun; Chen, Zhong-Ning
• Journal of publication: ACS applied materials & interfaces
• Year of publication: 2019
• Journal volume: 11
• Journal issue: 14
• Pages of publication: 13350 - 13358
• a: 10.4734 ± 0.0008 Å
• b: 11.0967 ± 0.0009 Å
• c: 18.1385 ± 0.0014 Å
• α: 100.647 ± 0.001°
• β: 92.198 ± 0.001°
• γ: 99.525 ± 0.001°
• Cell volume: 2038 ± 0.3 ų
• Cell temperature: 210 ± 2 K
• Ambient diffraction temperature: 210 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0381
• Residual factor for significantly intense reflections: 0.0322
• Weighted residual factors for significantly intense reflections: 0.0776
• Weighted residual factors for all reflections included in the refinement: 0.0805
• Goodness-of-fit parameter for all reflections included in the refinement: 1.036
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No