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Information card for entry 4514538
Preview
Coordinates | 4514538.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43 H40 Br2 N2 Pt Si2 |
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Calculated formula | C43 H40 Br2 N2 Pt Si2 |
SMILES | [Pt]1([n]2cc(ccc2c2[n]1cc(C#C[Si](C)(C)C)cc2)C#C[Si](C)(C)C)(C#Cc1cccc(Br)c1)C#Cc1cc(Br)ccc1.c1cc(ccc1)C |
Title of publication | Facile and Equipment-Free Data Encryption and Decryption by Self-Encrypting Pt(II) Complex. |
Authors of publication | Kang, Jiajia; Ni, Jun; Su, Mengmeng; Li, Yanqin; Zhang, Jianjun; Zhou, Huajun; Chen, Zhong-Ning |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2019 |
Journal volume | 11 |
Journal issue | 14 |
Pages of publication | 13350 - 13358 |
a | 7.2194 ± 0.0002 Å |
b | 16.1521 ± 0.0004 Å |
c | 18.698 ± 0.0005 Å |
α | 108.926 ± 0.002° |
β | 99.381 ± 0.002° |
γ | 94.409 ± 0.002° |
Cell volume | 2015.13 ± 0.1 Å3 |
Cell temperature | 210 ± 2 K |
Ambient diffraction temperature | 210 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0434 |
Residual factor for significantly intense reflections | 0.0353 |
Weighted residual factors for significantly intense reflections | 0.0863 |
Weighted residual factors for all reflections included in the refinement | 0.0905 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4514538.html
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