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Information card for entry 4514929
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Coordinates | 4514929.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Schwartz reagent |
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Chemical name | Bis(cyclopentadienyl)zirconium(IV) chloride hydride |
Formula | C10 H11 Cl Zr |
Calculated formula | C10 H11 Cl Zr |
SMILES | [cH]12[cH]3[cH]4[cH]5[cH]1[ZrH]16782345(Cl)[cH]2[cH]8[cH]7[cH]6[cH]12 |
Title of publication | Characterization of Reactive Organometallic Species via MicroED. |
Authors of publication | Jones, Christopher G.; Asay, Matthew; Kim, Lee Joon; Kleinsasser, Jack F.; Saha, Ambarneil; Fulton, Tyler J.; Berkley, Kevin R.; Cascio, Duilio; Malyutin, Andrey G.; Conley, Matthew P.; Stoltz, Brian M.; Lavallo, Vincent; Rodríguez, José A; Nelson, Hosea M. |
Journal of publication | ACS central science |
Year of publication | 2019 |
Journal volume | 5 |
Journal issue | 9 |
Pages of publication | 1507 - 1513 |
a | 7.21 ± 0.0014 Å |
b | 9.2 ± 0.0018 Å |
c | 13.84 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 918 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 58 |
Hermann-Mauguin space group symbol | P n n m |
Hall space group symbol | -P 2 2n |
Residual factor for all reflections | 0.1645 |
Residual factor for significantly intense reflections | 0.1495 |
Weighted residual factors for significantly intense reflections | 0.3625 |
Weighted residual factors for all reflections included in the refinement | 0.3785 |
Goodness-of-fit parameter for all reflections included in the refinement | 2.254 |
Diffraction radiation wavelength | 0.01969 Å |
Diffraction radiation type | 300KeVelectrons |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4514929.html
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