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Information card for entry 4515227
Preview
Coordinates | 4515227.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | catena-{[Cu2(amp)4Cl][Cr(ox)3].H2O |
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Formula | C30 H34 Cl Cr Cu2 N8 O13 |
Calculated formula | C30 H34 Cl Cr Cu2 N8 O13 |
SMILES | [Cu]12([NH2]Cc3[n]1cccc3)([NH2]Cc1[n]2cccc1)[Cl][Cu]12([n]3ccccc3C[NH2]1)[n]1ccccc1C[NH2]2.[Cr]123(OC(=O)C(=O)O1)(OC(=O)C(=O)O2)OC(=O)C(=O)O3.O |
Title of publication | Water Vapor Single-Gas Selectivity via Flexibility of Three Potential Materials for Autonomous Indoor Humidity Control |
Authors of publication | Tsobnang, Patrice Kenfack; Hastürk, Emrah; Fröhlich, Dominik; Wenger, Emmanuel; Durand, Pierrick; Ngolui, John Lambi; Lecomte, Claude; Janiak, Christoph |
Journal of publication | Crystal Growth & Design |
Year of publication | 2019 |
Journal volume | 19 |
Journal issue | 5 |
Pages of publication | 2869 |
a | 17.568 ± 0.005 Å |
b | 16.601 ± 0.005 Å |
c | 13.578 ± 0.005 Å |
α | 90° |
β | 68.486 ± 0.005° |
γ | 90° |
Cell volume | 3684 ± 2 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0849 |
Residual factor for significantly intense reflections | 0.0604 |
Weighted residual factors for significantly intense reflections | 0.1114 |
Weighted residual factors for all reflections included in the refinement | 0.1272 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.108 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4515227.html
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Users of the data should acknowledge the original authors of the
structural data.