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Information card for entry 4515367
Preview
| Coordinates | 4515367.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | UiO-67-OMe |
|---|---|
| Formula | C1.736 O1.028 S0.107 Zr0.118 |
| Calculated formula | C1.73647 O1.02777 S0.107304 Zr0.117647 |
| Title of publication | SuFEx in Metal-Organic Frameworks: Versatile Postsynthetic Modification Tool. |
| Authors of publication | Park, Seungjae; Song, Hayoung; Ko, Nakeun; Kim, Changhee; Kim, Kimoon; Lee, Eunsung |
| Journal of publication | ACS applied materials & interfaces |
| Year of publication | 2018 |
| Journal volume | 10 |
| Journal issue | 40 |
| Pages of publication | 33785 - 33789 |
| a | 26.693 ± 0.003 Å |
| b | 26.693 ± 0.003 Å |
| c | 26.693 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 19019 ± 4 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 225 |
| Hermann-Mauguin space group symbol | F m -3 m |
| Hall space group symbol | -F 4 2 3 |
| Residual factor for all reflections | 0.0722 |
| Residual factor for significantly intense reflections | 0.0661 |
| Weighted residual factors for significantly intense reflections | 0.2053 |
| Weighted residual factors for all reflections included in the refinement | 0.2148 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0045 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4515367.html
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